Introducing amorphous metal-imidazolate films (aZIFs) as innovative resists for extreme ultraviolet (EUV) lithography. These resists offer tunable composition and sub-nanometer thickness control, achieving sensitivity as low as 5 mJ/cm2, for advanced patterning applications.
Amorphous metal-imidazolate films (aZIFs) represent a new class of metal-organic resists designed for extreme ultraviolet (EUV) lithography. These films leverage the structural flexibility of zeolitic imidazolate frameworks (ZIFs), allowing for precise control over thickness and composition. By coordinating metal ions such as Zn, Co, and In with various imidazole anions, aZIFs achieve exceptional sensitivity and resolution, essential for advanced semiconductor patterning. These resists have demonstrated successful 20 nm pitch negative tone patterning and positive tone patterning in electron beam lithography (EBL), with a remarkable sensitivity as low as 5 mJ/cm² in EUV experiments.
The technology is at TRL 5, having been demonstrated in relevant environments with ongoing efforts to access high-resolution EUV lithography tools for further validation and development.
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